Japanese

 

 

CONTACT

Post Code: 615-8510
Department of Electronic Science and Engineering,
Kyoto University,
Katsura, Nishikyo-ku,
Kyoto, Japan

TEL/FAX:
+81-75-383-2272/2275

LAB. ADDRESS

Room 223,
Building A1,
Katsura Campus,
Kyoto University

Access to Katsura Campus

    INTRODUCTION

  • To be updated.
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    THEMES

  • To be updated.
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    DEVICES

  • 1.Electron beam evaporation (Py, Pt, Pd, Ta, Cu, Au, Ti, Fe, CuNi, Al, AuSb etc.)

  • 1Electron beam evaporation.jpg
  • 2.Pulse laser deposition (Bi, BiSb, W, Ta etc.)

  • 2Pulse laser deposition .jpg
  • 3.Joule heating evaporation system

  • 3 Joule heating evaporation system.jpg
  • 4.Ar-milling system with end point detection

  • 4 Ar-milling system with end point detection.jpg
  • 5.Polishing machine

  • 5 Polishing machine.jpg
  • 6.Plasma reactor

  • 6 Plasma reactor.jpg
  • 7.Precise digital scale

  • 7 Precise digital scale.jpg
  • 8.Annealing systems up to ~1200 C

  • 8 Annealing systems up to ~1200 C 2.jpg
  • 8 Annealing systems up to ~1200 C.jpg
  • 9.Wire bonding

  • 9 Wire bonding.jpg
  • 10.Dicing machine

  • 10 Dicing machine.jpg
  • 11.Physical Property Measurement System PPMS (1.8 - 297 K, magnetic field up to 9T)

  • 11 Physical Property Measurement System PPMS.jpg
  • 12.Vibrating sample magnetometer

  • 12 Vibrating sample magnetometer.jpg
  • 13.JEOL JES-FA200 Electron spin resonance spectrometer (100 - 470 K, 8.75 - 9.65 GHz, magnetic field up to 1.3 T)

  • 13 JEOL JES-FA200 Electron spin resonance spectrometer.jpg
  • 14.Four-probes station with magnetic field (4.2-297 K, magnetic field up to 0.3 T)

  • 14 Four-probes station with magnetic field.jpg
  • 15.Four-probes station (4.2-297 K)

  • 15 Four-probes station .jpg
  • 16.Thermally-induced spin transport measurement system

  • 16 Thermally-induced spin transport measurement system.jpg
  • 17.Probe station

  • 17 Probe station.jpg
  • 18.Cryostat for spin transport measurements (4.2-297 K, magnetic field up to 1 T)

  • 18 Cryostat for spin transport measurements .jpg
  • 19.Precision Semiconductor Parameter Analyzers

  • 19 Precision Semiconductor Parameter Analyzers.jpg
  • 20.Laser microscopy system

  • 20 Laser microscopy system.jpg
  • 21. Raman spectroscopy system

  • 21 Raman spectroscopy system.jpg
  • 22. Optical microscopes

  • 22 Optical microscopes.jpg
  • 23. X-ray photoelectron spectroscopy

  • 23 X-ray photoelectron spectroscopy.jpg
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